~in cooperation with tsinghua University and Hitachi (China) R&D Corp.~
Address: Room 2-201 FIT building
Time : 9:00am, Oct. 30, 2009
9:20~10:05 keynote speech
Xing Li (Tsinghua University)
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报告题目: Secondary Ion Mass Spectrometry with sub-keV O2+ beams at glancing incidence
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